Editorial Team
Jayesh Soni
Florida International University, USA
jsoni[at]fiu.edu
https://orcid.org/0000-0002-5740-4597
Florida International University, USA jsoni[at]fiu.edu https://orcid.org/0000-0002-5740-4597 Kishore Balasubramanian
Dr. Mahalingam College of Engineering & Technology, India
bkishore1979[at]gmail.com
https://orcid.org/0000-0003-1918-9774
Dr. Mahalingam College of Engineering & Technology, India bkishore1979[at]gmail.com https://orcid.org/0000-0003-1918-9774 Shinji Kawakura
Osaka City University, Japan
s.kawakura[at]gmail.com
https://orcid.org/0000-0003-4572-1189
Osaka City University, Japan s.kawakura[at]gmail.comhttps://orcid.org/0000-0003-4572-1189Suresh Kaswan
Sharda University, Uzbekistan
sureshkaswan[at]gmail.com
https://orcid.org/0000-0002-1528-8938
Sharda University, Uzbekistan sureshkaswan[at]gmail.comhttps://orcid.org/0000-0002-1528-8938Tinashe Magara
Chongqing University of Posts and Telecommunications, China
tinashenosh[at]gmail.com
https://orcid.org/0000-0003-4367-6281
Chongqing University of Posts and Telecommunications, Chinatinashenosh[at]gmail.comhttps://orcid.org/0000-0003-4367-6281Zohaib Mushtaq
University of Sargodha, Pakistan
zohaib.mushtaq[at]uos.edu.pk
https://orcid.org/0000-0002-5587-7614
University of Sargodha, Pakistanzohaib.mushtaq[at]uos.edu.pkhttps://orcid.org/0000-0002-5587-7614
